Discover... ISAE-SUPAERO’s cryogenic electrical tests facilities!
Available online :

14 February 2023
Discover... ISAE-SUPAERO’s cryogenic electrical tests facilities!
ISAE-SUPAERO - as a center for training through #research, research training and innovation - has many research equipments used within its 6 research departments.
Today, we present the cryogenic electrical tests facilities!
The ISAE-SUPAERO Image Sensor Research Group (CIMI) is studying sensors in the field of visible wavelengths but also for different spectral domains such as InfraRed (IR). The detection of these longer wavelengths (SWIR to LWIR) requires materials other than silicon for detection, associated with a silicon readout circuit for information processing, all operating at cryogenic temperature.
In this context, ISAE-SUPAERO has developed electrical and electro-optical characterization setups operating at low temperature for microelectronic circuits in order to extract and model the behaviours and performances of these circuits. These characterization setups allow to address both very simple devices, such as transistors, as complex components (complete image sensor) up to 120 inputs/ outputs.
ISAE-SUPAERO - as a center for training through #research, research training and innovation - has many research equipments used within its 6 research departments.
Today, we present the cryogenic electrical tests facilities!
The ISAE-SUPAERO Image Sensor Research Group (CIMI) is studying sensors in the field of visible wavelengths but also for different spectral domains such as InfraRed (IR). The detection of these longer wavelengths (SWIR to LWIR) requires materials other than silicon for detection, associated with a silicon readout circuit for information processing, all operating at cryogenic temperature.
In this context, ISAE-SUPAERO has developed electrical and electro-optical characterization setups operating at low temperature for microelectronic circuits in order to extract and model the behaviours and performances of these circuits. These characterization setups allow to address both very simple devices, such as transistors, as complex components (complete image sensor) up to 120 inputs/ outputs.